Six Slot Semiconductor Switch Matrix Mainframe with TSP-Link Multi Chassis Expansion and 707A 708A Command Emulation Compatible

The Keithley 707B is a six-slot semiconductor switch matrix mainframe built for parametric test, wafer-level characterization, and production test floors. It holds up to six 8*12 matrix cards, delivering a maximum matrix of 48 rows by 12 columns per chassis. It is fully compatible with the popular 7072, 7072-HV, 7173-50, and 7174A switch cards developed for the earlier 707A/708A mainframes, so existing card inventory carries straight over into the new chassis.

Compared with the 707A, the 707B dramatically shortens command-to-connect time. A single channel close on a 7174A low-current card completes in as little as 1.9 ms over Ethernet, GPIB, or USB, while the 7174A supports a maximum trigger rate of 815 setups per second. Faster switching means more devices tested per hour and a lower cost per measurement.

• Six card slots: accommodates up to six 8*12 matrix cards, interconnectable through the internal backplane or jumper links to build larger matrices.
• Legacy card compatibility: accepts 7072, 7072-HV, 7173-50, and 7174A cards designed for the 707A/708A, protecting existing switch investments.
• 707A/708A DDC command emulation: drop-in migration path for systems already running legacy code and hardware interfaces.
• Embedded TSP processor: Keithley Test Script Processor runs Lua-based test scripts on board, removing PC round trips and GPIB traffic congestion from the test loop.
• TSP-Link technology: high-speed, low-latency expansion bus; up to 16 chassis can be linked and controlled from a single master unit, with two TSP-Link connectors per mainframe for daisy chaining.
• Triple remote interface: LXI-certified Ethernet (10/100BaseT, auto-MDIX), GPIB IEEE-488.2, and USB 2.0 USBTMC, plus front panel manual control.
• 14 bits of digital I/O: open-drain I/O on a 25-pin D connector for handler and binning control, accessible on the fly from TSP scripts.
• Non-volatile memory: stores hundreds of switching configurations and channel patterns for instant recall.
• Seamless 4200-SCS integration: works with the existing 4200-SCS matrix driver and GPIB interface for semiconductor I-V and C-V characterization.
• Front panel clarity: alphanumeric row and column labelling, LED crosspoint display showing open and closed channels plus occupied slots, two-line message display, and navigation knob.
• Ultra-low current switching: standard triax connectors and cables throughout, supporting sub-picoamp measurements with 7174A or 7072 cards.
• Lab and fab ready: 3U rack height, rear rack mount hardware supplied, 100 V to 240 VAC universal power input.

• Wafer-level and package-level parametric test on semiconductor devices
• Sub-picoamp low-current I-V characterization using 7174A or 7072 cards
• C-V measurement from DC to 1 MHz with 7072 or 7072-HV cards
• Breakdown voltage and oxide integrity testing up to 1300 V
• Multi-pin automated test systems built around 2600B System SourceMeter SMU instruments and 4200-SCS parameter analyzers
• High-throughput production binning with handler control through digital I/O

CA-180-4A CAT 5 Ethernet crossover cable (1 m), CA-179-2A CAT 5 Ethernet cable (3 m), CO-7 line cord, and rear fixed rack mount hardware.

7072 semiconductor matrix card, 7072-HV high-voltage card, 7072-TRT triax fastening tool, 7173-50 high-frequency matrix card, 7174A low-current matrix card, 7079 rear slide rack mount kit, CA-126-7A digital I/O cable, 2600-TLINK trigger link cable, 7007-1 and 7007-2 GPIB cables, IVI-COM and IVI-C drivers, LabVIEW driver, TSP Toolkit software, and 3-year or 5-year extended warranty plans.