products details

Home Products

Tektronix MDO34/3-BW-500 Mixed Domain Oscilloscope, 4 CH, 500MHz, 2.5GS/S, 10Mpts, 3 Series MDO

Brand Name:	Tektronix
Model Number:	MDO34 3-BW-500
MOQ:	1 Unit
Price:	Contact Supplier for Pricing
Delivery Time:	7-15 Working Days
Payment Terms:	T/T,Western Union,PayPal

Detail Information

Place of Origin:

United States

Certification:

UL61010-1, CSA61010-1, EN61010-1, IEC 61010-1

Document:

Bandwidth:

500 MHz

Sample Rate:

2.5 GS/s (All 4 Channels)

Record Length:

25 M Points (Standard), Up To 125 M Points (Optional)

Analog Channels:

Rise Time:

700 Ps (Calculated)

Vertical Resolution:

8 Bits (>11 Bits With HiRes)

Input Impedance:

1 MΩ ±1% / 50 Ω ±1%

Maximum Waveform Capture Rate:

>250,000 Wfms/s

Display:

10.4 Inch XGA Touchscreen (1024 X 768)

Operating System:

Microsoft Windows 10 Enterprise IoT Edition

Dimensions:

233 Mm X 439 Mm X 206 Mm

Packaging Details:

Original Tektronix Factory Packaging with Shockproof Foam and Export Carton

Supply Ability:

10 Units per Month

Highlight:

Tektronix MDO34 mixed domain oscilloscope 500MHz

Product Description

Mixed Domain Oscilloscope, 4 Channel, 500 MHz, 2.5 GS/s, 10 Mpts, 3 Series MDO

Bandwidth: 500 MHz
Channels: 4
Sample Rate: 2.5 GS/s
Oscilloscope + Spectrum Analyzer on the same time domain
10 M record length on all channels
FastAcq™ waveform capture exceeding 280,000 waveforms per second
Standard passive voltage probes with 3.9 pF capacitive loading and 500 MHz analog bandwidth
11.6‑inch HD capacitive touchscreen optimized for touch and gesture control
Compact, lightweight form factor ideal for bench or field use
Spectrum Analyzer
- Frequency range: 9 kHz - 1 GHz (standard) or 3 GHz (optional)
- Ultra-wide capture bandwidth up to 3 GHz
Arbitrary Function Generator (optional)
- 13 predefined waveform types
- The Tektronix MDO34/3-BW-500 is a 500 MHz 4-channel 3 Series Mixed Domain Oscilloscope that integrates time-domain, frequency-domain, and optional logic analysis into a single compact instrument. Designed to simplify modern debugging workflows, it provides synchronized visibility across analog, digital, and RF signals, enabling engineers to identify issues faster while reducing bench clutter and setup complexity.