Send Message
Tel:
Shenzhen Meigaolan Electronic Instrument Co. Ltd
Shenzhen Meigaolan Electronic Instrument Co. Ltd

We will help you achieve your electronic plans.

Any project. Any budget.

Home ProductsEMC Test Equipment

NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display

NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display

  • NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display
  • NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display
  • NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display
NSG 3040 Multi Function Transient Generator EMC Integrated 7 Inch Touchscreen Display
Product Details:
Brand Name: Teseq AG
Model Number: NSG 3040
Payment & Shipping Terms:
Minimum Order Quantity: 1
Price: Negotiation
Packaging Details: Carton
Delivery Time: 1~3 Working Days
Supply Ability: In Stock
Contact Now
Detailed Product Description
Surge Voltage: 4.4 KV Burst Frequency:: 100 Hz To 1000 KHz
EFT: 4.8 KV Burst: 1 MHz
PQT: 16 A/260 VAC & DC
High Light:

NSG 3040 Transient Generator

,

Multi Function Transient Generator

,

Transient Test Generator Integrated Touchscreen

NSG 3040 

THE SMART 4 KV SOLUTION FORCE APPLICATIONS

 

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national, and manufacturers’ standards including the latest IEC/EN standards.

 

The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

 

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.

 

Teseq’s well-proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

 

The NSG 3040 integrates a high-quality 7-inch large color touchscreen display with excellent contrast, making controlling the NSG 3040 simple. Upon request, the integrated keyboard supports the use of a wheel with additional keys for input or sensitivity adjustment. The value of each parameter is clear, and all Settings can be quickly selected and modified with a large touch input button. The ramp function can be programmed quickly and easily without a stylus.

 

 

Multi-step test procedures can be created and their sequence or parameter values changed easily. Firmware downloads can be performed quickly with the easily accessible SD memory card reader. Tests specified by the user will be saved completely.

 

The NSG 3040 has an Ethernet port for external PC control.

 

 

Combination wave pulse 1, 2/50 – 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

Parameter Value
Pulse voltage (open circuit) ±200 V to 4.4 kV (in 1 V steps)
Pulse current (short circuit) ±100 A to 2.2 kA
Impedance 2/12 O
Polarity positive / negative / alternate
Pulse repetition 10 s, up to 600 s (in 1 s steps)
Test duration 1 to 9999 pulses, continuous
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling external / internal

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

Parameter Value
Pulse amplitude ±200 V to 4.8 kV (in 1 V steps) – open circuit
±100 V to 2.4 kV (50 O matching system)
Burst frequency 100 Hz to 1000 kHz
Polarity positive / negative / alternate
Repetition time 1 ms to 4200 s (70 min)
Burst time 1 µs to 1999 s, single pulse, continuous
Test duration 1 s to 1000 h
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling external / internal

Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

Parameter Value
Dips, Interrupts & Variations From EUT voltage input to 0 V, 0%
Uvar with optional variac depending on model (VAR 3005)
Uvar with step transformer 0, 40, 70, 80% (INA 650x)
Peak inrush current capability 500 A (at 230 V)
Switching times 1 to 5 µs (100 O load)
Event time 20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles
Test duration 1 s to 70’000 min, 1 to 99’999 events, continuous
Repetition time 40 µs to 35 min, 1 to 99’999 cycles
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
 

 

NSG 3040 - the smart 4 kV solution for CE applications

 

 

Contact Details
Shenzhen Meigaolan Electronic Instrument Co. Ltd

Contact Person: Cece

Tel: +8613480167449

Send your inquiry directly to us
Shenzhen Meigaolan Electronic Instrument Co. Ltd
RA1-B2,F32 of Dongjianghaoyuan, Baomin Rd, Bao'an District, Shenzhen,China
Tel:86-755-27883980
Mobile Site Privacy Policy | China Good Quality RF Spectrum Analyzer Supplier. © 2023 - 2024 rf-spectrumanalyzers.com. All Rights Reserved.