Tektronix DSA8300 Digital Serial Analyzer 70 GHz Oscilloscope

The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides the highest fidelity measurement and analysis capabilities for Communications Signal Analysis, Serial Data Network Analysis, and Serial Data Link Analysis applications.

• Low time base jitter:
  • 425 fs typical on up to 8 simultaneously acquired channels
  • <100 fs on up to 6 channels with 82A04B phase reference module
• Industry's highest vertical resolution - 16 bit A/D
• Electrical resolution: <20 µV LSB (for 1 v full range)
• Optical resolution from <20 nW for the 80C07B (1 mW full range) to <0.6 µW for the 80C10C (30 mW full range)
• Optical bandwidths to >80 GHz
• Electrical bandwidths to >70 GHz
• Over 120 automated measurements for NRZ, RZ, and pulse signal types
• Automated mask testing with over 80 industry-standard masks
• Complex jitter/noise/BER/SER analysis (80SJNB), support for complex measurements TDECQ 1, SNDR 2 (applications)

A wide variety of optical, electrical, and accessory modules support your specific testing requirements.

• Support optical data rates from 155 Mb/s to 10 Gb/s to 40 Gb/s to 100 Gb/s to PAM4 for 50G/100G/200G/400G
• Optical reference receivers (ORR) 1 support specified requirements for standards-mandated compliance testing
• High optical sensitivity, low noise, and wide dynamic range allows accurate testing of short-reach to long-haul optical communications standards
• Fully calibrated clock recovery solutions - no need to manually calibrate for data pick-off losses
• Calibrated extinction ratio measurements and variable correction ER measurement ensure accuracy and repeatability

• Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at 60 GHz, typical)
• Selectable bandwidths allow the user to trade-off sampler bandwidth and noise for optimal data acquisition performance
• Remote samplers or compact sampling extender module cables minimize signal degradation
• High-performance integrated TDR (10 ps typical step rise time) supports exceptional impedance discontinuity characterization

• Jitter, noise, and BER analysis of high-speed PAM4 and PAM2 NRZ serial data rates from <1 GBd to 60 GBd
• Analysis of PAM4 signals with comprehensive jitter, noise and BER analysis for each individual PAM eye
• 100G-SR4/Transmitter and Dispersion Eye Closure (TDEC) automation provides turn-key testing and debug
• 80STDEC streamlines high performance Transmitter and Dispersion Eye Closure (TDEC) measurement
• Automated mask testing with over 80 industry-standard masks
• Jitter, noise, BER, mask testing, and Serial Data Link Analysis (SDLA) through software options
• Advanced TDR analysis, S-parameter measurements, simulation model extraction capabilities
• 400G-M4 Optical Manufacturing Analysis Software provides Optical Transmitter and Dispersion Eye Closure Quaternary (TDECQ) analysis

• High sample acquisition rate up to 200 kS/s per channel
• Efficient programmatic interface (IEEE-488, Ethernet, or local processor access) enables high test throughput

• Design/Verification of telecom and datacom components and systems
• Manufacturing/testing for ITU/ANSI/IEEE/SONET/SDH compliance
• High-performance true-differential TDR measurements
• Impedance characterization and network analysis for serial data applications including S-parameters
• Advanced jitter, noise, BER and SDLA analysis
• Channel and eye diagram simulation and measurement-based modeling

The DSA8300 Digital Serial Analyzer is the most versatile tool for developing and testing communications, computers, and consumer electronics which use multi-gigabit data transmission. It is used for optical and electrical transmitter characterization, as well as compliance verification for devices, modules, and systems used in these products.

The DSA8300 is well-suited for electrical signal path characterization, whether for packages, PCBs, or electrical cables. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the DSA8300 provides the highest-performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.