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Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375

Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375

  • Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375
  • Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375
  • Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375
Remote control Spectrum Analyzer Optical , Long Wavelength Yokogawa AQ6375
Product Details:
Place of Origin: Japan
Brand Name: Yokogawa
Model Number: AQ6375
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: Negotiation
Payment Terms: T/T
Supply Ability: in stock
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Detailed Product Description
Product Name: Yokogawa Optical Spectrum Analyzer Measurement: Fast
High Wavelength Resolution: (0.05 Nm) High Sensitivity:: Down To -70dBm
Condition: Pre-Owned Functions:: Tested, In Full Working Conditions
High Light:

Remote Spectrum Analyzer Optical

,

0.05 nm Spectrum Analyzer Optical

,

Yokogawa AQ6375

Yokogawa AQ6375 Optical Spectrum Analyzer World Class Optical Performance Long Wavelength
Description of  Yokogawa AQ6375
  • The AQ6375 is the first bench-top optical spectrum analyzer covering the long wavelength over 2 μm.
    It is designed for researchers and engineers who have been struggling with inadequate test equipment to measure in these long wavelength ranges.
    The AQ6375 achieves high speed measurements with high accuracy, resolution and sensitivity in a compact frame, even while providing full analysis features and a built-in calibrator; troublesome calibration steps and the development of external analysis software is no longer required.
    Those features are indispensable to research, development, and manufacturing of optical devices in the wavelength range from telecom band to 2 μm.
    No other test system can achieve this high performance and ease of use at the same time.

​Feature:

  • Long wavelength measurement capability
  • High wavelength accuracy & resolution
  • Wide dynamic range
  • High sensitivity
  • High speed measurement
  • USB for mouse, keyboard, and memory
  • Remote operation (GP-IB, RS-232, Ethernet)
Function:
 
You can display the spectrum width and center wavelength using the following 4 types of calculation:
  • THRESH method
  • ENVELOPE method
  • RMS method
  • PEAK RMS method
Notch Width Measurement
 
  • With this function it is possible to measure pass band width / notch width from the measured waveform of a filter with V-type or U-type wavelength characteristics.
 
Light Source Analysis
  • Light source parameters can be analyzed from the measured waveform of each type of light source among DFB-LD, FP-LD and LED.PMD Measurement
  • It is possible to measure the polarization mode dispersion (PMD) of a DUT (such as an optical fiber) by using the instrument in combination with an analyzer, polarization controller, polarizer, and an amplified spontaneous emission (ASE) light source, high-output LED light source, or other wideband light source.

WDM Analysis

  • With this function it is easy to analyze WDM transmission signals. You can also measure OSNR of a DWDM transmission system with 50 GHz spacing. Measurements of WDM signal wavelength, level, wavelength interval, and OSNR can be made collectively on up to 1024 channels, and the analysis results can be displayed in a data table.

Optical Amp Analysis

  • Measurement can be performed of the optical amplifier gain and noise figure from measured waveform of the signal light going into the optical amp, as well as the measured waveform of the output light leaving the optical amp.

Optical Filter Characteristics Measurement

  • Optical filter characteristics can be measured from the measured waveform of the light input to the optical filter from the light source, as well as from the measured waveform light output from the optical filter.
  • Analysis can be performed not only on optical filters with only one mode, but also multimode WDM filters.

Measurement of Level Fluctuations in Single-Wavelength Light

  • This function is used to measure changes over time in the level of a specific wavelength level. The sweep width is set to 0 nm, and measurement of the single-wavelength light is taken. The horizontal axis is the time axes. It is useful for purposes such as optical axis alignment when a light source is input to an optical fiber.

Template Analysis

  • The template function compares preset reference data (template data) with a measured waveform. In addition, if a function for displaying the target spectrum (target line) on the measurement screen is used, the target spectrum can be referenced while adjusting the optical axis of an optical device.

Go/No Go Judgment

  • The Go/No Go test function compares the active trace waveform against reference data (template data) preset by the user, and performs a test on the measured waveform (Go/No Go test).
  • This function can be used effectively in situations such as pass/fail tests on production lines.

Analysis between Line Markers / in the Zoom Area

  • The instruments perform the analysis of the signal contained into boundaries selected by means of line markers or zoomed area.

Specifications

Data
storage
Internal memory 64 Traces, 64 programs, 3 template lines
Internal storage Max. 128 MByte
External USB storage (memory/HDD),
FAT32 format
File type CSV(text)/Binary, BMP/TIFF
Interface Remote
control
GP-IB, RS-232 and Ethernet (TCP/IP)
AQ6317 series compliant commands
(IEEE488.1) and IEEE488.2 full support
Category GP-IB 2 (standard/controller), RS-232,
Ethernet, USB1.1 2, PS/2 (keyboard),
SVGA output, Analog output port, Trigger
input port, Trigger output port
Optical

connector
Optical input port (free-space): AQ9447 (*)
connector adapter required
Calibration output port (physical contact):
AQ9441 (*) connector adapter required

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Contact Details
Shenzhen Meigaolan Electronic Instrument Co. Ltd

Contact Person: Susan

Tel: 86 13480167449

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Shenzhen Meigaolan Electronic Instrument Co. Ltd
RA1-B2,F32 of Dongjianghaoyuan, Baomin Rd, Bao'an District, Shenzhen,China
Tel:86-755-27883980
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